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This course will teach theory and practice for high-accuracy correlative light and electron microscopy. Students will learn high-accuracy CLEM on resin embedded samples using SEM approaches (Peddie et al. 2014) as well as using TEM according to the procedures developed in the Briggs group at EMBL (Kukulski et al. 2011). The course will also cover the extension of this approach to cryo-EM specimens (Schorb and Briggs 2014), and more recently developed equipment and work flows for cryo-CLEM.