Abstract

The primary aim of this series of Workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques. The Workshops are organised in such a way as to maximise transfer of knowledge among the participants and to provide a comprehensive exhibition of the latest analytical equipment. The programme includes time and opportunities for participants to visit the technical exhibitions and interact with the manufacturers. Previous Workshops in this series were held in Antwerp (1989), Dubrovnik (1991), Rimini (1993), St. Malo (1995), Torquay (1997), Konstanz (1999), Tampere (2001), Chiclana de la Frontera (2003), Florence (2005), Antwerp (2007), Gdansk (2009), Angers (2011), Porto (2013), Portorož (2015), and Konstanz (2017). They included sessions covering electron (EPMA, TEM, SEM, Auger, EELS), ion (SIMS, FIB), and nuclear (RBS, NRA) microbeam methods. The main topics of the Sixteenth Workshop (EMAS 2019) are: electron probe microanalysis (EPMA); electron backscatter diffraction (EBSD); automated mineralogy; µ-XRF fluorescence; complementary techniques such as combined Raman and EDS, 3D SEM-EDS microanalysis, combined TEM and atom probe tomography; and materials applications of microbeam analysis. Time will also be devoted to problem orientated applications in material science, geological science, environmental studies, astrophysics, microelectronics, forensics, cultural heritage and archaeology, nanomaterials, surfaces and interfaces, catalysts, sensors,