Search a Conference through our dedicated search page

FCMN — International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

2nd April 2019 - 4th April 2019
Monterey, California, United States


The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.

Related Fields